The PADME charged particle detector system aims to detect positrons and electrons with efficiency better than 99 % and time resolution below 1 ns. The system hosts about 200 readout electronics channels whose operation has to be verified and commissioned. A custom based test system allowing performing qualitative check of the detector and the front-end electronics has been developed. The initial tests and the performance of the front-end electronics are described and discussed. Time resolution better than 400 ps was achieved.

A test system for the front-end electronics of the PADME charged particle detector system / Antonova, Iveta; Ceravolo, Sergio; Corradi, Giovanni; Georgiev, Georgi; Kozhuharov, Venelin; Mitev, Mityo; Valente, Paolo; Raggi, Mauro; Tsankov, Ludmil. - STAMPA. - 2017-:(2017), pp. 1-4. (Intervento presentato al convegno 26th International Scientific Conference Electronics, ET 2017 tenutosi a Bulgaria nel 2017) [10.1109/ET.2017.8124360].

A test system for the front-end electronics of the PADME charged particle detector system

Kozhuharov, Venelin;Raggi, Mauro;
2017

Abstract

The PADME charged particle detector system aims to detect positrons and electrons with efficiency better than 99 % and time resolution below 1 ns. The system hosts about 200 readout electronics channels whose operation has to be verified and commissioned. A custom based test system allowing performing qualitative check of the detector and the front-end electronics has been developed. The initial tests and the performance of the front-end electronics are described and discussed. Time resolution better than 400 ps was achieved.
2017
26th International Scientific Conference Electronics, ET 2017
Front-end electronics; LED driver; Scintillation detectors; Energy Engineering and Power Technology; Electrical and Electronic Engineering; Instrumentation
04 Pubblicazione in atti di convegno::04b Atto di convegno in volume
A test system for the front-end electronics of the PADME charged particle detector system / Antonova, Iveta; Ceravolo, Sergio; Corradi, Giovanni; Georgiev, Georgi; Kozhuharov, Venelin; Mitev, Mityo; Valente, Paolo; Raggi, Mauro; Tsankov, Ludmil. - STAMPA. - 2017-:(2017), pp. 1-4. (Intervento presentato al convegno 26th International Scientific Conference Electronics, ET 2017 tenutosi a Bulgaria nel 2017) [10.1109/ET.2017.8124360].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1097274
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